| Title: |
Ultra-low leakage power switch for RO array characterization in 18nm FD-SOI technology platform validation |
| Authors: |
Cagli, C.; Degoirat, H.; Lamy, M.; Pourchon, F.; Moulard, J. B.; Granoux, F.; Dahmani, M.; Wilson, R. |
| Source: |
2026 IEEE 38th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2026 IEEE 38th International Conference on. :1-4 Mar, 2026 |
| Relation: |
2026 IEEE 38th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |