Characteristics of P-Type Polysilicon Resistors from Cryogenic to High Temperatures and Modeling
| Title: | Characteristics of P-Type Polysilicon Resistors from Cryogenic to High Temperatures and Modeling |
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| Authors: | Wang, Yili; Xia, Kejun; Niu, Guofu; Xia, Jim; Hamilton, Michael |
| Source: | 2026 IEEE 38th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2026 IEEE 38th International Conference on. :1-5 Mar, 2026 |
| Relation: | 2026 IEEE 38th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: | IEEE Xplore Digital Library |