| Title: |
MRAM Wafer Level Adaptative Edge Testing for Efficient Yield and Reliability Control |
| Authors: |
Liehr, Maximilian; Ogden, Sean; Raymond, Mark; Funk, Kyle; Elemva, Herve; Lee, Kilho; Feng, Gen; Beckmann, Karsten; Chavent, Antoine; Ngoc, Tien Dang; Grout, Daniel; Lequeux, Steven; Salimy, Siamak |
| Source: |
2026 IEEE 38th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2026 IEEE 38th International Conference on. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE 38th International Conference on Microelectronic Test Structures (ICMTS) |
| Database: |
IEEE Xplore Digital Library |