High-Sensitivity Thickness Measurement of Transparent Optical Thin Films via EEMD-Based Fresnel Phase Diffraction
| Title: | High-Sensitivity Thickness Measurement of Transparent Optical Thin Films via EEMD-Based Fresnel Phase Diffraction |
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| Authors: | Onay, F.; Karatay, A.; Atac, E. |
| Source: | IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 75:1-8 2026 |
| Database: | IEEE Xplore Digital Library |