| Title: |
Reliability Assessment of Deep Neural Networks and Accelerators Across Design Stages |
| Authors: |
Ahmadilivani, Mohammad Hasan; Cherezova, Natalia; Glab, Michael; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Sierra, Robert Limas; Poelhs, Leticia Bolzani; Raik, Jaan; Roquet, Lucas; Santos, Fernando Fernandes dos; da Silva, Felipe Augusto; Reorda, Matteo Sonza; Veronesi, Alessandro; Castillo, Ernesto Cristopher Villegas; Condia, Josie E. Rodriguez |
| Source: |
2026 IEEE 27th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2026 IEEE 27th. :1-10 Mar, 2026 |
| Relation: |
2026 IEEE 27th Latin American Test Symposium (LATS) |
| Database: |
IEEE Xplore Digital Library |