Fast Statistical Estimation of Circuit-Level Cross Section Considering Logical Masking Effects
| Title: | Fast Statistical Estimation of Circuit-Level Cross Section Considering Logical Masking Effects |
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| Authors: | Farias, Clayton R.; Balen, Tiago R.; Butzen, Paulo F. |
| Source: | 2026 IEEE 27th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2026 IEEE 27th. :1-6 Mar, 2026 |
| Relation: | 2026 IEEE 27th Latin American Test Symposium (LATS) |
| Database: | IEEE Xplore Digital Library |