| Title: |
Machine Fault Identification Using a Digital Twin-Based Augmented Vision Framework with IoT-Enabled Sensors |
| Authors: |
Elavarasi, K.; Javith, Z. Mohammed; Imran, N.; RajKumar, K. |
| Source: |
2026 1st International Electronics & Packaging Technologies Conference: Bridging Skills & Innovation for India’s Industry (EPT India) Electronics & Packaging Technologies Conference: Bridging Skills & Innovation for India’s Industry (EPT India), 2026 1st International. :192-197 Mar, 2026 |
| Relation: |
2026 1st International Electronics, Packaging, Design & Manufacturing Conference (EPDMC) |
| Database: |
IEEE Xplore Digital Library |