Statistical Analysis of Metal Grain Granularities Induced Variability in 4T Complementary FET SRAM Cell
| Title: | Statistical Analysis of Metal Grain Granularities Induced Variability in 4T Complementary FET SRAM Cell |
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| Authors: | Patil, Deven H; Kumar, Sandeep; Rathore, Sunil; Dasgupta, S.; Bagga, Navjeet |
| Source: | 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026 |
| Relation: | 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| Database: | IEEE Xplore Digital Library |