| Title: |
Unveiling Gate Leakage Dynamics in Nanosheet FETs at Cryogenic Temperature: A TCAD Study |
| Authors: |
Singh, Prabhat; Malvika; Shakir, Mohd.; Kumar, Sandeep; Rathore, Sunil; Bagga, Navjeet; Dasgupta, S. |
| Source: |
2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026 |
| Relation: |
2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| Database: |
IEEE Xplore Digital Library |