Benchmarking Contact Doping Approaches in Ab Initio Simulation of 2D Transistors
| Title: | Benchmarking Contact Doping Approaches in Ab Initio Simulation of 2D Transistors |
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| Authors: | Tho, Che Chen; Ang, Yee Sin |
| Source: | 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2026 10th IEEE. :1-3 Mar, 2026 |
| Relation: | 2026 10th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) |
| Database: | IEEE Xplore Digital Library |