TID Effects on Lateral Charge Migration In 3-D Charge-Trap NAND Memory
| Title: | TID Effects on Lateral Charge Migration In 3-D Charge-Trap NAND Memory |
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| Authors: | Kumar, Mondol Anik; Ray, Biswajit |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-6 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |