| Title: |
Variability and Retention Investigation for Ferroelectric FET with Pseudo-MFMIS Structure |
| Authors: |
Ono, Ryo; Ota, Kensuke; Shuto, Yusuke; Okuno, Jun; Yonai, Tsubasa; Sakakibara, Masaki; Lederer, Maximilian; Reinig, Peter; Seidel, Konrad; Alcala, Ruben; Schroeder, Uwe; Mikolajick, Thomas; Kato, Akihiko; Umebayashi, Taku; Akiyama, Kentaro |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-6 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |