| Title: |
Two-Dimensional Materials and Wide Bandgap Semiconductors: Integration Challenges and Novel Device Applications (Invited) |
| Authors: |
Giannazzo, F.; Panasci, S. E.; Schiliro, E.; Greco, G.; Vivona, M.; Nigro, R. Lo; Fiorenza, P.; Roccaforte, F. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-10 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |