| Title: |
Methodology for Extrapolating the Lifetime of GaN HEMTs with p-GaN Gate |
| Authors: |
Fraccaroli, R.; Fregolent, M.; Dell'Andrea, M.; Rossetto, I.; De Santi, C.; Pirani, A.; Millefanti, A.; Pizzo, G.; Fezzi, V.; Castagna, M. E.; Miccoli, C.; Iucolano, F.; Meneghesso, G.; Zanoni, E.; Meneghini, M. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |