| Title: |
Transistor Reliability in 18A RibbonFET Technology |
| Authors: |
Novak, Steven; Bowonder, Anupama; Towner, David; Ali, Dyan; Lugo, Ferando; Surdi, Harshad; Hicks, Jeff; Choi, Kihyun; Joshi, Kaustubh; Broas, Mikael; Muralidharan, Pradyumna; Ramamurthy, Rahul Pandey Rahul; Mukhopadhyay, Subhadeep; Kaya, Yasin; Meric, Inanc |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |