A Compact Physics-Aware Full $I-V$ Model for Nanowire nFET Aging
| Title: | A Compact Physics-Aware Full $I-V$ Model for Nanowire nFET Aging |
|---|---|
| Authors: | Vandemaele, Michiel; Chasin, Adrian; Franco, Jacopo; Tyaginov, Stanislav; Claes, Dieter; Mertens, Hans; De Keersgieter, An; Hellings, Geert; Kaczer, Ben |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-10 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |