A Multi-Die Self-Consistent Framework for Thermal Stability Analysis in Nanosheet 3D SiPs
| Title: | A Multi-Die Self-Consistent Framework for Thermal Stability Analysis in Nanosheet 3D SiPs |
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| Authors: | Chen, Yukai; Brunion, Moritz; Walker, Matthew; Biswas, Dwaipayan; Ryckaert, Julien; Myers, James |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-6 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |