Technology and Particle LET Dependence of SER Voltage Sensitivity in Advanced FinFET D Flip-Flops
| Title: | Technology and Particle LET Dependence of SER Voltage Sensitivity in Advanced FinFET D Flip-Flops |
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| Authors: | Zhao, X.; Kronenberg, J. B.; Tolson, S. L.; Xiong, Y.; Pieper, N. J.; Ball, D. R.; Bhuva, B. L. |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-8 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |