| Title: |
Neutron-Induced Soft Error Measurements of Rad-Hard DICE Flip-Flops with Shared and Isolated Well Layouts |
| Authors: |
Kim, Junkyu; Bloom, Robert; Yi, Yonghyeon; Kim, Chris H.; Lim, Chulseung; Jang, Ilho; Jin, Jungho; Hwang, Yuchul; Chun, Kichul |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |