Accelerated Reliability Characterization of Ferroelectric Capacitors Using Physics-Informed Bayesian Active Learning
| Title: | Accelerated Reliability Characterization of Ferroelectric Capacitors Using Physics-Informed Bayesian Active Learning |
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| Authors: | Alam, Shumiya; Bhojak, Kharanshu; Pantha, Tanvir Haider; Chakraborty, Biswadeep; Das, Niladri; Dutta, Sourav |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |