Circuit-Level Simulation of Well-to-Well Charging Effects and Verification of Protection Schemes
| Title: | Circuit-Level Simulation of Well-to-Well Charging Effects and Verification of Protection Schemes |
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| Authors: | Chu, Yu-Lin; Kuo, Hsi-Yu; Poon, Steven Sze Hang; Lee, Jen-Hao; Lu, Ryan; Xia, Kejun |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-4 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |