| Title: |
Spacer Trapping Effect on Hot Carriers Degradation Dynamics for Advanced FDSOI Nodes |
| Authors: |
Frutuoso, T. Mota; Vandendaele, W.; Mayolet, J.; Mohamed, B.; Kanyandekwe, J.; Laraignou, L.; Dartois, M.; Bringuier, F.; Lapras, V.; Jousseaume, V.; Guerin, C.; Raison, A.; Romanjek, K.; Chalupa, Z.; Cyrille, M. C.; Fenouillet-Beranger, C.; Duriez, B.; Garros, X. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |