| Title: |
Channel-Side Interlayer Engineering in Laminated Fe-FETs: Trap-Driven Optimization of Memory Window, Retention, and Disturb in Ferroelectric NAND Flash |
| Authors: |
Fernandes, Lance; Shon, Minji; Venkatesan, Prasanna; Ravikumar, Priyankka; Song, TaeYoung; Tian, Mengkun; Kim, Kijoon; Hwang, Woohyun; Seo, Kwangyou; Lim, Suhwan; Kim, Kwangsoo; Kim, Wanki; Ha, Daewon; Padovani, Andrea; Datta, Suman; Yu, Shimeng; Khan, Asif |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-8 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |