| Title: |
Radiation Reliability of BEOL Compatible Ga-Doped Indium Oxide MOSFETs for eDRAM Applications |
| Authors: |
Kirtania, Sharadindu Gopal; Zhang, Chengyang; Wodzro, Stuart E.; Waqar, Faaiq G.; Lee, Hyun Jae; Chakraborty, Dyutimoy; Yeager, Jason Dean; Wolfe, Douglas E.; Khan, Asif; Yu, Shimeng; Datta, Suman |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |