| Title: |
Comprehensive Reliability Analysis on Advanced CMOS Technology Featuring 2nm Nanosheet FET |
| Authors: |
Lee, Jen-Hao; Huang, Jun-Yu James; Chen, Pin-Shiang; Lee, Yi-Wen; Chuang, Hsin-Jou; Chiu, Josh; Chen, Eliot; Teng, An-Shun; Huang, Clement; Liao, Pei-Jean; Lu, Ryan |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-4 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |