Robust Power-Rail Clamp Circuit for ESD and Surge Protection in FinFET Integrated Circuits
| Title: | Robust Power-Rail Clamp Circuit for ESD and Surge Protection in FinFET Integrated Circuits |
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| Authors: | Lin, Ya-Ting; Ker, Ming-Dou; Huang, Ta-Yi; Li, Jih-San |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |