Angle-Dependent Magnetic Field Immunity of 16nm Embedded STT-MRAM
| Title: | Angle-Dependent Magnetic Field Immunity of 16nm Embedded STT-MRAM |
|---|---|
| Authors: | Chan, Hsin-I; Chiu, Kuan-Cheng; Weng, Chih-Hui; Cheng, Chih-Lin; Wang, C.Y.; Wu, Chun-Yu; Wang, Allen; Ong, Yi Ching; Chuang, Harry; Lee, Yuan-Jen; Ko, Chih-Hsin |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-6 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |