| Title: |
Pinning Model of Wake-Up and Fatigue in Hf-Based Ferroelectrics |
| Authors: |
Truijen, B.; Higashi, Y.; Kaczer, B.; O'Sullivan, B.; Roussel, P.J.; Chasin, A.; Bizindavyi, J.; Mukherjee, S.; Popovici, M.; Ronchi, N.; Rosmeulen, M.; Belmonte, A.; Van Houdt, J. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |