Determination of the Lower Dead Time Threshold for the Onset of Bipolar Degradation in SiC MOSFETs
| Title: | Determination of the Lower Dead Time Threshold for the Onset of Bipolar Degradation in SiC MOSFETs |
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| Authors: | Herrmann, C.; Prenzel, J.; Basler, T. |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-9 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |