| Title: |
Transient Short-Channel Effects Induced by Si $\delta$ Doping in Buffer-Free $\mathrm{L}_{\mathrm{G}}=0.15 \mu \mathrm{m}$ AlGaN/GaN HEMTs |
| Authors: |
De Pieri, F.; De Santi, C.; Rossetto, I.; Carlotto, A.; Roy Chowdhury, S.; Saro, M.; Rampazzo, F.; Stieglauer, H.; Grunenputt, J.; Sommer, D.; Chen, Jr-Tai; Meneghini, M.; Meneghesso, G.; Zanoni, E. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |