| Title: |
Dynamic on-State Breakdown of GaN-on-Si HEMT |
| Authors: |
Yu, Hao; Gupta, A.; Kuo, Y.-C.; Chong, Y.; Wu, T.-L.; Yadav, S.; ElKashlan, R.; Banerjee, S.; Hahn, H.; Mauder, C.; Rathi, A.; Wu, W.-M.; Esfeh, B. Kazemi; Bury, E.; Vermeersch, B.; O'Sullivan, B.; Alian, A.; Asad, M.; Peralagu, U.; Parvais, B.; Collaert, N. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-8 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |