| Title: |
Electrical Detection of Latent Silicide Diffusion in Advanced DRAM Using Gate-Induced Drain Leakage Asymmetry |
| Authors: |
Park, Gahui; Tcho, Ilwoong; Ahn, Yongsoo; Park, Seran; Heo, Sunwoo; Hwang, Beomyong; Jeon, Changhoon; Min, Hyosun; Woo, Dongsoo; Chae, Kyosuk; Lee, Byunghyun; Park, Seguen |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-10 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |