SE-Induced Parasitic BJTs at Advanced Bulk FinFET Nodes
| Title: | SE-Induced Parasitic BJTs at Advanced Bulk FinFET Nodes |
|---|---|
| Authors: | Kronenberg, J. B.; Xiong, Y.; Pieper, N. J.; Tolson, S. L.; Zhao, X.; Ball, D. R.; Bhuva, B. L. |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |