Ground-Plane Effect on Random Telegraph Noise in Mesa-Isolated SOI MOSFETs for 3D Sequential CIS
| Title: | Ground-Plane Effect on Random Telegraph Noise in Mesa-Isolated SOI MOSFETs for 3D Sequential CIS |
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| Authors: | Machmach, A.; Theodorou, C.; Balestra, F.; Place, S.; Gauthier, O.; Joblot, S.; Ponthenier, F.; Lacord, J. |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |