| Title: |
Fast In-Situ TDDB Prediction Method for HKMG Oxide Stacks |
| Authors: |
Sharma, Uma; Knoll, Aaron; Samiee, Mehran; Subirats, Alexandre; Ulrich, Matthew; Bhoir, Mandar S.; Panda, Durga P.; Khanna, Abhishek; Srivastava, Shivani; Mocuta, Dan; Owens, Timothy J. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |