| Title: |
Predictive Outlier Screening of I/O Aging Using Enhanced Stress Tests and Monte Carlo Models |
| Authors: |
Shivan, N.; Narayan, A.; Shroff, M. D.; Satasia, J.; Brent, C.; Hess, T.; Flores, J.; Schlotterback, F.; Madere, M.; Lewey, R.; Boas, A. Vilas; Wu, C.; Hamze, K.; Dickson, K.; Yang, R.; Kakani, V.; Swan-Mazza, V.; Herrin, S.; Wilson, T.; Patel, A.; Richards-Chacon, C. |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |