Reliability Verification of Trench MOSFETs in Blocking Mode
| Title: | Reliability Verification of Trench MOSFETs in Blocking Mode |
|---|---|
| Authors: | Salmen, P.; Ziemys, G.; Schaefer, M.; Aichinger, T. |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-5 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |