Ultra-Fast TLP Characterization of Gate-All-Around (GAA) ESD Diodes for Low-Capacitance Optimized I/Os
| Title: | Ultra-Fast TLP Characterization of Gate-All-Around (GAA) ESD Diodes for Low-Capacitance Optimized I/Os |
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| Authors: | Kumar, Anish K; Domanski, Krzysztof; Dua, Raj S; Menon, Reshma R; Ishfaq, Umair; Shamutete, Salukazi; Klotz, Florian |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-9 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |