Product Reliability of Embedded RRAM in 28 nm
| Title: | Product Reliability of Embedded RRAM in 28 nm |
|---|---|
| Authors: | Van Dijk, K.; Van Duuren, M.J.; Serpenti, V.H.G.; Schmid, B.A.; Harp, T. |
| Source: | 2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-6 Mar, 2026 |
| Relation: | 2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: | IEEE Xplore Digital Library |