| Title: |
Product Reliability of Commercial Vertical SiC Power MOSFETs Achieved by Optimized Screening |
| Authors: |
Biswas, Ayan K.; Lichtenwalner, Daniel J.; Woods, Callie; Sabri, Shadi; Ryu, Sei-Hyung; Hull, Brett; Barkley, Adam; Gajewski, Donald A.; Balkas, Elif |
| Source: |
2026 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2026 IEEE International. :1-7 Mar, 2026 |
| Relation: |
2026 IEEE International Reliability Physics Symposium (IRPS) |
| Database: |
IEEE Xplore Digital Library |