Reliability of Amorphous Silicon Gap-Type TFT as Optical Sensor for Indirect X-Ray
| Title: | Reliability of Amorphous Silicon Gap-Type TFT as Optical Sensor for Indirect X-Ray |
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| Authors: | Li, C.; Lin, C.; Lai, C.; Tai, Y. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(6):3485-3492 Jun, 2026 |
| Database: | IEEE Xplore Digital Library |