Lithography Passivation Gate: Enhanced Current and Breakdown Performance in Copolymer Organic Thin-Film Lateral Power Devices
| Title: | Lithography Passivation Gate: Enhanced Current and Breakdown Performance in Copolymer Organic Thin-Film Lateral Power Devices |
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| Authors: | Lin, H.; Zhang, J.; Zhang, H.; Chang, H.; Yang, K.; Yao, J.; Chen, J.; Li, M.; Zhang, G.; Bai, S.; Guo, Y. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 73(7):4346-4353 Jul, 2026 |
| Database: | IEEE Xplore Digital Library |