A Compact-Area Digital-Output CMOS Test Module for Random Telegraph Noise Characterization
| Title: | A Compact-Area Digital-Output CMOS Test Module for Random Telegraph Noise Characterization |
|---|---|
| Authors: | Campoverde, Juan; Cuenca-Michans, Javier; Comas, Pol; Janssen, Guido; Starr, Roy; Teres, Lluis; Serra-Graells, Francisco |
| Source: | 2026 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2026 IEEE International Symposium on. :3022-3026 May, 2026 |
| Relation: | 2026 IEEE International Symposium on Circuits and Systems (ISCAS) |
| Database: | IEEE Xplore Digital Library |