| Title: |
A Fully-Buried Transfer Gate and Polysilicon Wire: Noise Enhancement Technology for CMOS Image Sensors with 2-Layer Pixels |
| Authors: |
Lee, Changkyu; Seo, Myunghae; Lim, Jihun; Kim, Sooyeon; Jang, Minho; Park, Jongeun; Cho, KeunYeong; Kim, Jinyoung; Kim, Minkwan; Jo, Yongkun; Kim, YoonSeok; Park, Dami; Park, Gyunha; Song, Jiyoun; Son, Sungmin; Park, Yongsang; Lim, Hajin; Go, Jonghyun; Song, Jaihyuk |
| Source: |
2026 IEEE/JSAP Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2026 IEEE/JSAP Symposium on. :1-3 Jun, 2026 |
| Relation: |
2026 IEEE/JSAP Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) |
| Database: |
IEEE Xplore Digital Library |