Testing of a 12 bit SARA And Cand Analog Scan
| Title: | Testing of a 12 bit SARA And Cand Analog Scan |
|---|---|
| Authors: | Coyette, Anthony; Dobbelaere, Wim; Dima, Doina; Billa, Arlind; Jurga, Krzysztof; Zivkovic, Vladimir; Sunter, Stephen |
| Source: | 2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026 |
| Relation: | 2026 IEEE European Test Symposium (ETS) |
| Database: | IEEE Xplore Digital Library |