MD-SCAN method for low power scan testing
| Title: | MD-SCAN method for low power scan testing |
|---|---|
| Authors: | Yoshida, T.; Watari, M. |
| Source: | Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02). Asian test symposium Test Symposium, 2002. (ATS '02). Proceedings of the 11th Asian. :80-85 2002 |
| Relation: | Eleventh Asian Test Symposium |
| Database: | IEEE Xplore Digital Library |