| Title: |
An automated method for test model generation from switch level circuits |
| Authors: |
McDougall, T.; Parashkevov, A.; Jolly, S.; Juhong Zhu; Jing Zeng; Pyron, C.; Abadir, M. |
| Source: |
Proceedings of the ASP-DAC Asia and South Pacific Design Automation Conference, 2003. Design automation conference Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific. :769-774 2003 |
| Relation: |
Conference of Asia and South Pacific Design Automation 2003 |
| Database: |
IEEE Xplore Digital Library |