Internal behavior of BCD ESD protection devices under very-fast TLP stress
| Title: | Internal behavior of BCD ESD protection devices under very-fast TLP stress |
|---|---|
| Authors: | Blaho, M.; Pogany, D.; Gornik, E.; Zullino, L.; Morena, E.; Stella, R.; Andreini, A. |
| Source: | 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. Reliability physics symposium Reliability Physics Symposium Proceedings, 2003. 41st Annual. 2003 IEEE International. :235-240 2003 |
| Relation: | International Reliability Physics Symposium |
| Database: | IEEE Xplore Digital Library |