A modular test structure for CMOS mismatch characterization
| Title: | A modular test structure for CMOS mismatch characterization |
|---|---|
| Authors: | Conti, M.; Crippa, P.; Fedecostante, F.; Orcioni, S.; Ricciardi, F.; Turchetti, C.; Vendrame, L. |
| Source: | 2003 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and systems Circuits and Systems (ISCAS), 2003 IEEE International Symposium on. 5:V-V 2003 |
| Relation: | 2003 IEEE International Symposium on Circuits and Systems (ISCAS) |
| Database: | IEEE Xplore Digital Library |