Automated test model generation from switch level custom circuits
| Title: | Automated test model generation from switch level custom circuits |
|---|---|
| Authors: | Abadir, M.S.; Zeng, J.; Pyron, C.; Zhu, J. |
| Source: | 2003 Test Symposium Twelfth asian symposium Test Symposium, 2003. ATS 2003. 12th Asian. :184-187 2003 |
| Relation: | Proceedings of the Twelfth Asian Symposium, ATS 2003 |
| Database: | IEEE Xplore Digital Library |